- Click the Selection tool .
- Choose Edit > Edit Filter.
A dialog box appears.
- Click Stem and Beam Alterations. Click OK (or
press ENTER).
- Select the source measures (the ones containing
the custom stems).
- Drag the first source measure so that it’s
superimposed on the first target measure. Unless you’re dragging
to a measure directly above or below the source measure, the Copy
Measures
dialog box appears.
- Specify how many times you want the stemming
information copied. Click OK.